Scanning probe microscopy : Characterization, nanofabrication and device application of functional materials /
Scanning probe microscopy : Characterization, nanofabrication and device application of functional materials /
Ed. by Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon.
- Dordrecht ; Boston : Kluwer Acad. Publ., 2005.
- xxxvii, 488 p. : ill. ; 25 cm.
- NATO Science Series II: Mathematics, Physics and Chemistry Vol. 186 .
Includes bibliogr. references
1402030177 (acidfree paper)
Materials--Microscopy--Congresses
Scanning probe microscopy--Congresses
Includes bibliogr. references
1402030177 (acidfree paper)
Materials--Microscopy--Congresses
Scanning probe microscopy--Congresses
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