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Defects in high-k gate dielectric stacks : Nano-electronic semiconductor devices / Ed. by Evgeni Gusev.

Contributor(s): Gusev, Evgeni [edt] | North Atlantic Treaty Organization Scientific Affairs Division | NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices ( 2005 : St. Petersburg, Russia)Material type: Text

TextLanguage: English Series: NATO Science Series. Series II : Mathematics, Physics and Chemistry ; Vol. 220Publication details: Dordrecht, The Netherlands : Springer, 2006Description: x, 492 p. : illISBN: 140204366X (PB); 1402043651 (HB); 1402043678 (e-book)Subject(s): Gate array circuits -- Congresses | Dielectrics -- Congresses | Semiconductors -- Defects -- Congresses

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Holdings
Item type	Current library	Collection	Call number	Status	Notes	Date due	Barcode
Գրքեր/Books	Fundamental Scientific Library	General	621.315.592 (Browse shelf(Opens below))	Available	30 Days Loan		320112921
Գրքեր/Books	Fundamental Scientific Library	General	621.315.592 (Browse shelf(Opens below))	Available	30 Days Loan		320112922

"Proceedings of the NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices, held July 11-14, 2005, in St. Petersburg, Russia." - Colophon.

Includes bibliogr. references and indexes

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