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Analiza topografii ukladow scalonych VLSI pod katem ich produkowalnosci / Witold A. Pleskacz.

TextLanguage: Polish Summary language: English Series: Politechnika warszawska ; Z. 172Publication details: Warszawa : Oficyna wydaw. Politech. warszawskiej, 2009Description: 119 p. : illSubject(s): VLSI integrated circuits- Critical area- Test vectors generation

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Holdings
Item type	Current library	Collection	Call number	Status	Notes	Date due	Barcode
Գրքեր/Books	Fundamental Scientific Library	General	ПИ 1723/172 (Browse shelf(Opens below))	Available	30 Days Loan		FL0157849

Includes bibliogr. references : (p. 107-116)

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